NAVEEN; EDWARD. LOW-OVERHEAD DMC DESIGN INSIGHTS FOR ROBUST MEMORY RELIABILITY UNDER MULTIPLE CELL UPSETS. International Journal of Data Science and IoT Management System, [S. l.], v. 2, n. 2, p. 5–8, 2023. DOI: 10.64751/. Disponível em: https://ijdim.com/journal/index.php/ijdim/article/view/25. Acesso em: 25 may. 2026.