P. Vijay Goud, Dayyala Jahnavi, Dundigala Anjali, and Gunti Kamal, “Multi-scale Deep Learning-based Robust Surface Defect Inspection for Enhancing Industrial Quality Control”, Int. J. Data. Sci. IoT. Manag. Syst., vol. 5, no. 2(1), pp. 469–478, Apr. 2026, doi: 10.64751/ijdim.2026.v5.n2(1).805.