P. VIJAY GOUD; DAYYALA JAHNAVI; DUNDIGALA ANJALI; GUNTI KAMAL. Multi-scale Deep Learning-based Robust Surface Defect Inspection for Enhancing Industrial Quality Control. International Journal of Data Science and IoT Management System, [S. l.], v. 5, n. 2(1), p. 469–478, 2026. DOI: 10.64751/ijdim.2026.v5.n2(1).805. Disponível em: https://ijdim.com/journal/index.php/ijdim/article/view/805. Acesso em: 26 apr. 2026.